Family Test Adapters
Universal Test System will become
Dear Customers, as you know M3000 Test
system is more then 20 years on the market. for past few years M3000
system has been produced in company UNITES Systems a.s., previously
SZ-UNITES a.s. Unfortunately, we have been informed by many suppliers they are not
able to supply us parts for M3000 anymore due to components obsoleteness.
The production of Family Test Adapters will continue in their original construction. Now UNITES Systems a.s. offers improved and innovated
follower of M3000 > The UNIMET Universal Test System.
is fully compatible with former M3000 system, Test
adapters and M3000 options. It means temporary customer does not need to
sacrifice former investments. Unites provides full support and service
including applications transfer. Such compatibility and flexibility
comparing to the cost of an acquirement is absolutely unique in ATE
UNIMET sets new
standards of Power/Price ratio - you get mid-cost mixed signal test system
for low-cost system price!
- Mixed Signal Test system ? Yes, UNIMET is equipped
with new digital bus, new digital pin electronic unit -- DDPEL and DTIMU -
time measurement unit. Features of these instruments allows user to use
far more flexible and power-full mixed features than former M3000. Usage
of modern devices like FPGA and dedicated memories, registers provide
sophisticated and highly programmable and flexible hardware processing
unreachable with former M3000 "discrete 7400" devices.
new Analog features
new VI sources up to 50 V
• new Analog bus - can carry data faster, smaller
signals, better synchronized
• new system voltmeter
• re-designed VS source
• new calibration and self-test features - dedicated
CAST adapters to calibrate and self-test VI sources
• new power supplies rack - with temperature
sensors, electronic fuses, under-voltage, etc.
system is capable and designed to make real characterization of devices.
As there are now also "mixed" signal and intelligent discrete
devices, UNIMET is focused to especially DYNAMIC parameters
characterization. The dynamic features testing is highly demanded and
useful for automotive, aerospace, space, RF com, R&D labs, research
UNITES last experience is a request of customer to characterize
also dynamic parameters even in in-coming inspection. As a production and
application of intelligent power devices will rise in near future the
demand for full testing of devices will include also dynamic parameters
testing and measurement.
Relays, Linear Voltage Regulators, Smart Power Devices, Opto Couplers,
Discretes, A/D and D/A converters, OpAmps and Comparators,
LSI & Memories, SSI/MSI Logic