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Bopolar transitors
• MOSFETs
• Diodes
• Zener diodes
• Voltage regulators
• Low pin count devices
Test time
• Bipolar transistors 35 ms
• Diodes 25 ms
Competitive advantages
• Flexible and cost effective
soluotion
• Easy programming and
debugging of test program
• Life-cycle support
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HW specification
• Multi-site and carousel capability
• Flexible pin electronics
• Extendable DUT pincounts
• Minimized relays switching
• Configurable measuring VI sources - CVI
• Relays self-diagnostic on-the-fly
• Waveform generation capability on 100 kHz sample rate
• SW calibration
• Standard configuration of TH up to 4 CVI boards
Configurable CVI firmware for future enhancements
CVI - Combine VI sources
One CVI board designed for testing up to 3-pin devices
• 2xVI source 30 V / 3 A
• HV source 600 V / 10 mA
• Leagake current meter from 100 nA range
• Sophisicated switching matrix
CVIs can be grouped for testing multi devices or more pin devices
Application SW - TA107
• Easy and fast menu - like TP programming
• Wide library of standard test items
• Test time per test and total test time
• Test item editor for customer specific test items
creation
• Stop At Fail possibility to get shorter test time
• SW scope tracer to analyze test conditions and results
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